Built-In Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

by Cheng Liu, Xiaowei Li, Guihai Yan

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With the end of Dennard scaling and Moore's law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance...

Format:Hardcover

Language:English

ISBN:9811985502

ISBN13:9789811985508

Release Date:March 2023

Publisher:Springer

Length:304 Pages

Weight:1.39 lbs.

Dimensions:0.8" x 6.1" x 9.2"

Related Subjects

Computers Computers & Technology

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Built-In Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

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