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Hardcover Atomic Scale Characterization and First-Principles Studies of Si₃n₄ Interfaces Book
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ISBN: 144197816X

ISBN13: 9781441978165

Atomic Scale Characterization and First-Principles Studies of Si₃n₄ Interfaces

(Part of the Springer Theses Series)

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Format: Hardcover

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This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as... This description may be from another edition of this product.

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Science Science & Math Science & Scientists Science & Technology

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