Skip to content
Scan a barcode
Scan
Paperback Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques Book

ISBN: 3642072119

ISBN13: 9783642072116

Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques

Select Format

Select Condition ThriftBooks Help Icon

Recommended

Format: Paperback

Condition: New

$119.99
50 Available
Ships within 2-3 days

Book Overview

Integrated Cantilevers and Atomic Force Microscopes.- Electrostatic Microscanner.- Low-Noise Methods for Optical Measurements of Cantilever Deflections.- Q-controlled Dynamic Force Microscopy in Air and Liquids.- High-Frequency Dynamic Force Microscopy.- Torsional Resonance Microscopy and Its Applications.- Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy.- Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale.-...

Customer Reviews

0 rating
Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks® and the ThriftBooks® logo are registered trademarks of Thrift Books Global, LLC
GoDaddy Verified and Secured