Applied Scanning Probe Methods I

by Sumio Hosaka and Harald Fuchs

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This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies,...

Format:Hardcover

Language:English

ISBN:3540005277

ISBN13:9783540005278

Release Date:January 2004

Publisher:Springer

Length:476 Pages

Weight:1.92 lbs.

Dimensions:1.1" x 6.1" x 9.2"

Related Subjects

Engineering Science Science & Math Science & Scientists Science & Technology Technology

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Applied Scanning Probe Methods I

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