Skip to content
Scan a barcode
Scan
Paperback Applied Computing & Information Technology Book

ISBN: 3319799487

ISBN13: 9783319799483

Applied Computing & Information Technology

Improving Relevancy Filter Methods for Cross-Project Defect Prediction.- A Game Framework Supporting Automatic Functional Testing for Games.- Feature Extraction and Cluster Analysis using n-gram Statistics for DAIHINMIN Programs.- Prediction Interval of Cumulative Number of Software Faults Using Multilayer Perceptron.- Heuristics for Daihinmin and Their Effectiveness.- Cluster Analysis for Commonalities between Words of Different Languages.-...

Recommended

Format: Paperback

Condition: New

$169.99
50 Available
Ships within 2-3 days

Customer Reviews

0 rating
Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks® and the ThriftBooks® logo are registered trademarks of Thrift Books Global, LLC
GoDaddy Verified and Secured