Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

by Philippe Pougnet, Pierre-Richard Dahoo, Abdelkhalak El Hami

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To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics.

This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering...

Format:Hardcover

Language:English

ISBN:1786306409

ISBN13:9781786306401

Release Date:March 2021

Publisher:Wiley-Iste

Length:256 Pages

Weight:1.16 lbs.

Dimensions:0.6" x 6.1" x 9.2"

Related Subjects

Engineering Technology

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Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

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