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Hardcover Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations Book
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ISBN: 1441909303

ISBN13: 9781441909305

Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations

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Soft Errors.- Analytical Determination of Radiation-induced Pulse Width in Combinational Circuits.- Analytical Determination of the Radiation-induced Pulse Shape.- Modeling Dynamic Stability of SRAMs in the Presence of Radiation Particle Strikes.- 3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits.- Clamping Diode-based Radiation Tolerant Circuit Design Approach.- Split-output-based Radiation Tolerant Circuit...

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Format: Hardcover

Condition: New

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Computers Computers & Technology Engineering Technology

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