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Paperback Analog IC Reliability in Nanometer CMOS Book
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ISBN: 1489986308

ISBN13: 9781489986306

Analog IC Reliability in Nanometer CMOS

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This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune...

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Format: Paperback

Condition: New

$109.99
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Engineering Technology

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