Advanced Scanning Electron Microscopy and X-Ray Microanalysis
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Book Overview
This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con- tinued to evolve and expand...
Format:Paperback
Language:English
ISBN:1475790295
ISBN13:9781475790290
Release Date:June 2013
Publisher:Springer
Length:454 Pages
Weight:1.39 lbs.
Dimensions:1.0" x 6.0" x 9.0"
Related Subjects
Basic Sciences Biological Sciences Chemical Electron Microscopes & Microscopy Engineering Experiments, Instruments & Measurement Internal Medicine Medical Medical Books Medicine Optics Pathology Physics Science Science & Math Science & Scientists Science & Technology Technology TextbooksCustomer Reviews
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