Most Popular Books
- Nanometer-Scale Defect Detection Using Polarized Light
- Embedded Mechatronic Systems, Volume 2: Analysis of Failures, Modeling, Simulation and Optimization
- Embedded Mechatronic Systems, Volume 1: Analysis of Failures, Predictive Reliability
- Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
- Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method
